Texas Instruments SN74LV8T373MPWREP
Manufacturer No:
SN74LV8T373MPWREP
Manufacturer:
Texas Instruments
Package:
Description:
Enhanced product octal transparent D-type latches with integrated level translator
Quantity:
In Stock :4653
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Expected Shipping：Fri, May 29 - Sat, May 30, 2026
Lead Time：Inquire about availability
Date Code：Within 2 Years
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SN74LV8T373MPWREP Information
Texas Instruments SN74LV8T373MPWREP technical specifications, attributes, parameters and parts with similar specifications to Texas Instruments SN74LV8T373MPWREP.
- Type
- Parameter
- Technology family
- LVxT
- Number of channels
- 8
- IOH (max) (mA)
- -25
- IOL (max) (mA)
- 25
- Features
- Over-voltage tolerant inputs
- Input type
- TTL/CMOS
- Output type
- CMOS
- Operating temperature range (°C)
- -55 to 125
- Package
- TSSOP (PW)
- Pins
- 20
- Type
- Parameter
- Size
- 41.6 mm² 6.5 x 6.4
- REACH Status
- Yes
- RoHS Status
- RoHS Compliant
Download datasheets and manufacturer documentation for Texas Instruments SN74LV8T373MPWREP.
Radiation & reliability report:
Data sheet:
The SN74LV8T373-EP device is an octal transparent D-type latch designed for 2V to 5.5V VCC operation.
The input is designed with a reduced threshold circuit to support up translation when the supply voltage is larger than the input voltage. Additionally, the 5V tolerant input pins enable down translation when the input voltage is larger than the supply voltage. The output level is always referenced to the supply voltage (VCC) and supports 1.8V, 2.5V, 3.3V, and 5V CMOS levels.
- Wide operating range of 1.65V to 5.5V
- 5.5V tolerant input pins
- Single-supply voltage translator (refer to LVxT Enhanced Input Voltage):
- Up translation:
- 1.2V to 1.8V
- 1.5V to 2.5V
- 1.8V to 3.3V
- 3.3V to 5.0V
-
Down translation:
- 5.0V, 3.3V, 2.5V to 1.8V
- 5.0V, 3.3V to 2.5V
- 5.0V to 3.3V
- Up translation:
- Up to 150Mbps with 5V or 3.3V VCC
- Supports standard function pinout
- Latch-up performance exceeds 250mAper JESD 17
- Supports defense and aerospace applications:
- Controlled baseline
- One assembly and test site
- One fabrication site
- Extended product life cycle
- Product traceability
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