Texas Instruments SN74AHC273DGSR

Manufacturer No:

SN74AHC273DGSR

Manufacturer:

Texas Instruments

Package:

Description:

Octal D-Type Flip-Flops With Clear

Quantity:

In Stock :8718

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Expected Shipping：Fri, May 29 - Sat, May 30, 2026

Lead Time：Inquire about availability

Date Code：Within 2 Years

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SN74AHC273DGSR Information

Texas Instruments SN74AHC273DGSR technical specifications, attributes, parameters and parts with similar specifications to Texas Instruments SN74AHC273DGSR.

Type
Parameter

Number of channels
8

Technology family
AHC

Supply voltage (min) (V)
2

Supply voltage (max) (V)
5.5

Input type
Standard CMOS

Output type
Push-Pull

Clock frequency (max) (MHz)
110

IOL (max) (mA)
8

IOH (max) (mA)
-8

Supply current (max) (µA)
40

Type
Parameter

Features
Balanced outputs, High speed (tpd 10-50ns), Over-voltage tolerant inputs

Operating temperature range (°C)
-40 to 125

Rating
Catalog

Package
PDIP (N)

Pins
20

Size
228.702 mm² 24.33 x 9.4

Package
SOIC (DW)

Pins
20

Size
131.84 mm² 12.8 x 10.3

Package
SOP (NS)

Download datasheets and manufacturer documentation for Texas Instruments SN74AHC273DGSR.

These devices are positive-edge-triggered D-type flip-flops with a direct clear ( CLR) input.

Information at the data (D) inputs meeting the setup time requirements is transferred to the Q outputs on the positive-going edge of the clock (CLK) pulse. Clock triggering occurs at a particular voltage level and is not directly related to the transition time of the positive-going pulse. When CLK is at either the high or low level, the D input has no effect at the output.

Operating range 2V to 5.5V VCC
Contain eight flip-flops with single-rail outputs
Direct clear input
Individual data input to each flip-flop
Latch-up performance exceeds 250mA per JESD 17
ESD protection exceeds JESD 22
- 2000V human-body model (A114-A)
- 1000V charged-device model (C101)
On products compliant to MIL-PRF-38535, All parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters.