Renesas CD4029BHNSR

The CD4029BMS consists of a four-stage binary or BCD-decade up/down counter with provisions for look-ahead carry in both counting modes. The inputs consist of a single CLOCK, CARRY-IN (CLOCK ENABLE), BINARY/DECADE, UP/DOWN, PRESET ENABLE, and four individual JAM signals. Q1, Q2, Q3, Q4 and a CARRY-OUT OUT signal are provided as outputs. A high PRESET ENABLE signal allows information on the JAM INPUTS to preset the counter to any state asynchronously with the clock. A low on each JAM line, when the PRESET-ENABLE signal is high, resets the counter to its zero count. The counter is advanced one count at the positive transition of the clock when the CARRY-IN-IN and PRE-SET ENABLE signals are low. Advancement is inhibited when the CARRY-IN or PRESET ENABLE signals are high. The CARRY-OUT signal is normally high and goes low when the counter reaches its maximum count in the UP mode or the minimum count in the DOWN mode provided the CARRY-IN signal is low. The CARRY-IN signal in the low state can thus be considered a CLOCK ENABLE. The CARRY-IN terminal must be connected to VSS when not in use. Binary counting is accomplished when the BINARY/DECADE input is high; the counter counts in the decade mode when the BINARY/DECADE input is low. The counter counts up when the UP/DOWN input is high, and down when the UP/DOWN input is low. Multiple packages can be connected in either a parallel-clocking or a ripple-clocking arrangement. Parallel clocking provides synchronous control and hence faster response from all counting outputs. Ripple-clocking allows for longer clock input rise and fall times. The CD4029BMS is supplied in these 16-lead outline packages: Braze Seal DIP H4X, Frit Seal DIP H1F and Ceramic Flatpack H6W.

• High-voltage type (20V rating)
• Medium-speed operation: 8MHz (Typ.) at CL = 50pF and VDD - VSS = 10V
• Multi-package parallel clocking for synchronous high-speed output response or ripple clocking for slow clock input rise and fall times
• "Preset Enable" and individual "Jam" inputs provided
• Binary or decade up/down counting
• BCD outputs in decade mode
• 100% tested for maximum quiescent current at 20V
• 5V, 10V and 15V parametric ratings
• Standardized symmetrical output characteristics
• Maximum input current of 1µA at 18V over full package temperature range; 100nA at 18V and +25 °C
• Noise margin (over full package temperature range):
  • 1V at VDD = 5V
  • 2V at VDD = 10V
  • 2.5V at VDD = 15V
• Meets all requirements of JEDEC tentative standards No. 13B, "Standard Specifications for Description of "B" Series CMOS Device's