Texas Instruments 54SC8T9541MPWTSEP
Manufacturer No:
54SC8T9541MPWTSEP
Manufacturer:
Texas Instruments
Package:
Description:
Radiation-tolerant 8-bit fixed-direction level translator with Schmitt-Trigger inputs
Quantity:
In Stock :1094
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Expected Shipping：Fri, May 29 - Sat, May 30, 2026
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Date Code：Within 2 Years
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54SC8T9541MPWTSEP Information
Texas Instruments 54SC8T9541MPWTSEP technical specifications, attributes, parameters and parts with similar specifications to Texas Instruments 54SC8T9541MPWTSEP.
- Type
- Parameter
- Technology family
- LVT
- Bits (#)
- 8
- Data rate (max) (Mbps)
- 150
- Vout (min) (V)
- 0
- Supply current (max) (mA)
- 0.22
- Features
- Output enable, Partial power down (Ioff), Vcc isolation
- Applications
- GPIO, SPI
- Rating
- Space
- Operating temperature range (°C)
- -55 to 125
- Package
- TSSOP (PW)
- Type
- Parameter
- Pins
- 20
- Size
- 41.6 mm² 6.5 x 6.4
- REACH Status
- Yes
- RoHS Status
- RoHS Compliant
Download datasheets and manufacturer documentation for Texas Instruments 54SC8T9541MPWTSEP.
Radiation & reliability report:
Data sheet:
The SN54SC8T9541-SEP contains eight buffers with 3-state outputs and Schmitt-Trigger inputs. The active low output enable pins (OE1 and OE2) control all eight channels, and are configured so that both must be low for the outputs to be active. When the outputs are enabled, the outputs are actively driven low or high. When the outputs are disabled, the outputs are set into the high-impedance state. The output level is referenced to the supply voltage (VCC) and supports 1.8V, 2.5V, 3.3V, and 5V CMOS levels.
The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2V input to 1.8V output or 1.8V input to 3.3V output). In addition, the 5V tolerant input pins enable down translation (for example, 3.3V to 2.5V output).
- Vendor item drawing available, VID V62/25633-01XE
- Radiation - Total Ionizing Dose (TID):
- TID characterized up to 50krad(Si)
- TID performance assurance up to 30krad(Si)
- Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
- Radiation - Single-Event Effects (SEE):
- Single Event Latch-Up (SEL) immune up to 50MeV-cm2/mg at 125°C
- Single Event Transient (SET) characterized up to LET = 50MeV-cm2/mg
-
Wide operating range of 1.2V to 5.5V
-
Single-supply voltage translator:
-
Up translation:
-
1.2V to 1.8V
-
1.5V to 2.5V
-
1.8V to 3.3V
-
3.3V to 5.0V
-
-
Down translation:
- 5.0V, 3.3V, 2.5V to 1.8V
- 5.0V, 3.3V to 2.5V
- 5.0V to 3.3V
-
- 5.5V tolerant input pins
- Supports standard pinouts
- Up to 150Mbps with 5V or 3.3V VCC
- Latch-up performance exceeds 250mA per JESD 17
- Space enhanced plastic:
- Supports defense and aerospace applications
- Controlled baseline
- Au bondwire and NiPdAu lead finish
- Meets NASA ASTM E595 outgassing specification
- One fabrication, assembly, and test site
- Extended product life cycle
- Product traceability
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