Microchip 090-53100-002
Manufacturer No:
090-53100-002
Manufacturer:
Microchip
Package:
Description:
53100A Phase Noise ADEV
Quantity:
In Stock :8399
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Shipped from：HK Warehouse
Expected Shipping：Sun, May 31 - Mon, Jun 1, 2026
Lead Time：Inquire about availability
Date Code：Within 2 Years
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User Guide
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PURCHASE
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SHIPPING COST
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DELIVERY TIME1. Once the goods are shipped, estimated delivery time depends on the shipping methods you chose: FedEx International, 5-7 business days.
2. For in-stock parts, orders normally could be shipped out within 1-2days.
090-53100-002 Information
Microchip 090-53100-002 technical specifications, attributes, parameters and parts with similar specifications to Microchip 090-53100-002.
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Download datasheets and manufacturer documentation for Microchip 090-53100-002.
Brochures:
Designed to measure the amplitude, phase and frequency stability of high-performance RF sources, the 53100A tells you everything you need to know about the stability characteristics of your devices, at timescales ranging from femtoseconds to days. From use on a bench-top or embedded into rack-mount ATE systems, the small formfactor and industry-leading measurement speed makes this test set versatile for multiple applications.
Allan deviation (ADEV) typically less than 5E-15 at t=1s, 1E-16 at t=1000s Measure up to 3 devices simultaneously Close-to-carrier Phase noise and AM noise at offsets from 0.001 Hz Single or dual reference oscillator inputs allow cross-correlation measurements with noise floor approaching -175dBc/Hz Modified Allan deviation (MDEV), Hadamard deviation (HDEV), and time deviation (TDEV), jitter, residual FM, and SSB carrier/noise ratio Independent input and reference frequencies from 1 to 200 MHz No phase-locking or measurement calibration required
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12.28 M
Listed Part Number
3,000+
Leading Manufacturers
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In-stock SKU
15,000+
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